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EE3001:Solid State Devices

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Intrinsic temperature(Ti) is defined as the temperature at which the intrinsic concentration ni equals the doping concentration N. Calculate the value of Ti for Si with doping concentration ND = 10^15 cm−3 and assuming Nc and Nv to be independent of temperature. [Given EG,Si = 1.12 eV, Nc=2.8 × 10^19 cm−3, and Nv=10^19 cm−3. At 300 K kBT=0.026 eV.]. Enter answer without units.

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1016 phosphorus atoms/cm3 are introduced in Si. Assuming complete ionization, EG,Si = 1.12 eV, Nc=3.2 x 1019(T/300)1.5 cm−3 and Nv=1.8 x 1019 (T/300)1.5 cm−3, kBT=0.026 eV (at 300 K) and ni = 1010 /cm3 (at 300 K), find out electron concentration in the conduction band at 600 K. If your answer in the format a * 1016 , enter only a without units upto four significant digits.

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Intrinsic temperature (Ti) is defined as the temperature at which the intrinsic concentration ni equals the doping concentration N. Calculate the value of Ti for GaAs with doping concentration ND = 10^14 cm−3 and assuming Nc and Nv to be independent of temperature. [Given EG,GaAs = 1.43 eV, Nc=4.7 × 10^17 cm−3 and Nv=7 × 10^18 cm−3. At T=300 K kBT=0.026 eV.] Enter answer without units.

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The

position of the Fermi level for a silicon sample is at E

f

= Ei +

0.45 eV at 300 K. The sample is uniformly illuminated, thereby generating an

additional 10

14 electron-hole pairs per cm3

per second.

The minority carrier lifetime in this sample is 1 μs. Assume n

i

for

Si is 10

10 /cm3

and kT = 26 meV at 300 K. For this

illuminated sample,

at

300 K the position of electron quasi Fermi level (in eV) is at E

Fn

=

Ei +

at

300 K the position of hole quasi Fermi level (in eV) is at E

Fp

= Ei

+

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A phosphorus doped (1016 atoms/cm3

)

Si sample has resistivity of

𝝆

Ω-cm. This sample is now doped with additional boron

atoms to increase the resistivity of the doped sample to

at least 4𝝆

.  Assume that due to this additional boron

doping electron and hole mobilities are not changed and electron mobility is

three times of the hole mobility throughout. The concentration of the

additional boron atoms required is within the range from

× 1016 atoms/cm3 to × 1016 atoms/cm3.

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Consider a p-type silicon sample with Ef

= E

i - 0.35 eV and a n-type silicon sample with Ef

= Ei +

0.35 eV. The built-in (contact) potential across the junction of these two

materials (in Volts) is ………

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